Agenda: * 0:00 - 3:30 | Welcome! Jie Ren, Merck & Co., Inc. * 3:30 - 26:15 | Leopoldo Sarra, MPI for Sci. Light - Unsupervised feature extraction in simple Physical Models through Mutual Information Maximization * 26:15 - 46:45 | Samuel Kim, MIT - Integration of Neural Network-Based Symbolic Regression in Deep Learning for Scientific Discovery * 46:45 - 1:06:00 | William Mitchell, Belmont University - Modeling Time-dependent Nonlinear Signal Processing Effects using Deep Neural Networks
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